计算机与现代化 ›› 2010, Vol. 1 ›› Issue (6): 140-0143.doi: 10.3969/j.issn.1006-2475.2010.06.040
• 计算机控制 • 上一篇 下一篇
刘映群
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LIU Ying-qun
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摘要： 介绍一种基于SOPC（可编程片上系统）技术实现的集成电路芯片自动测试系统，采用支持NIOS II软核的Cylone II EP2C35器件为主要部件，并将测试结果通过LCD液晶显示器显示出来。将此系统用于测试74系列中、小规模集成电路芯片，达到了很高的精度，而且可以利用FPGA软、硬件的可编程性，灵活地实现对其它系列器件的测试。
关键词: 可编程片上系统, IP核, 集成电路, 自动测试系统
Abstract: This paper introduces a integrated circuit chip automatic test systems based on SOPC technology, NIOS II softcore Cylone II EP2C35 device is used as the main component. Test results are displayed through the liquid crystal display. When this system applying to test in small and mediumscale integrated circuit chip of 74 series, it reaches very high precision, and can take advantage of FPGA hardware and software programmability, flexibly implementation of other devices test.
Key words: SOPC, IP core, integrated circuit, automatic test system
中图分类号:
TP273
刘映群. 基于SOPC技术的集成电路芯片自动测试系统[J]. 计算机与现代化, 2010, 1(6): 140-0143.
LIU Ying-qun. Integrated Circuit Chip Automatic Test System Based on SOPC Technology[J]. Computer and Modernization, 2010, 1(6): 140-0143.
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http://www.c-a-m.org.cn/CN/Y2010/V1/I6/140
